Aaron Gallant:  Strain data and deflections from full-scale four-point bending test of micropile threaded connections  Chakraborty Prabhuda:  Secure and Trustworthy Microelectronics: Vulnerabilities, Solutions, and Trends Caitlin Howell:  Mass-manufactured diffraction pattern enables large-scale spectroscopic, temporal, and spatial measurements of fluid movement and mixing  Published on October 9th and included CS undergraduate student Bradan Craig as well read more MCEC October Faculty Publications